Analytical electron microscopy standards for a variety of applications
Periodic Today specializes in producing calibration and reference standards designed for SEM users.
Our crafted products undergo quality control procedures in our laboratory and are compatible with renowned SEM brands such as FEI / Thermo Fisher, Hitachi, Jeol, Phenom, Tescan and Zeiss microscopes.
If your SEM brand is not listed, please don’t hesitate to contact us through our contact page. We offer customized standards tailored to meet your specific requirements.
Our calibration standards are a collection of reference materials, consisting of elements or compounds, designed for various calibration tasks. These standards are a vital component for calibration, resolution testing, and performance testing of your imaging and analytical EDS system.
Reference standards consist of compounds and minerals, used to test several aspects of the analytical X-ray system. Such as (auto) peak ID, peak deconvolution, quantification, and EDS window properties.
Periodic Today offers several services to help you with your SEM imaging and microanalysis needs. We can prepare and analyse a variety of samples with special expertise in automated particle analysis. Our pricing options are flexible, ranging from a fee per sample run to daily or weekly rates.
Even when treated with care, samples can contaminate or get damaged. When performance or condition no longer meet your requirements, refurbishment becomes a cost-effective solution to restore your standards to optimal condition.