Calibration Standards for SEM (Scanning Electron Microscope)
Discover unparalleled precision with our meticulously designed range of standards for electron microscope and EDS system calibration. Our standard stubs feature a Faraday Cup for precise probe/specimen current measurement, finished with a carbon-coating for conductivity and ease of imaging in any system.
Used for BSD response, contrast and brightness setting for automation, or EDS calibration and resolution measurements, with the wide variety of calibration samples there is one for every part of your electron microscope.
Made from high purity materials, embedded and polished for optimal results. Embedded in aluminum pin stubs or stainless steel, or on request in other base materials. There is a range of customized option. For example the use of traceable magnification calibration samples. Drop us an email if you cannot find what you are looking for.