Al-Ti-Mo BSD & EDS sample

Aluminum, Titanium and Molybdenum embedded in a 12.5mm aluminum pin stub. The materials are embedded close together to allow observation within 1 field of view in the SEM (500µm) The sample is polished to 0.5 µm surface finish and coated with 10nm carbon coating.

Can be mounted on these SEM brands:
FEI / Thermo Fisher, Hitachi*, Jeol*, Phenom, Tescan and Zeiss microscopes.

  • Product number: stub 34
  • Price per unit: € 340,-
*Require a pin stub adapter
Periodic Today Ta/Si fusion – Z contrast vs X-ray contrast sample
Periodic Today Ta/Si fusion – Z contrast vs X-ray contrast sample