Silicon - Tungsten fusion sample

Si/W fusion – Z contrast vs X-ray contrast sample. Mounted and polished in a standard 12.5 mm aluminum pin stub.

Can be mounted on these SEM brands:
FEI / Thermo Fisher, Hitachi*, Jeol*, Phenom, Tescan and Zeiss microscopes.

• Product number: 01_SiW
• Price per unit: € 260,-

*Require a pin stub adapter