Traceable 5-light element EDS calibration sample with copper grid

5 certified materials mounted and polished in a standard 12.5 mm aluminum pin stub⁶, each marked with a unique serial number for 5-year traceability.

In the center of the stub is a 3.05 mm copper 200 mesh grid to serve as Cu/Al reference, as well as image size reference⁷. Each sample is accompanied by a booklet containing backscattered electron imaging and a Certificate of Analysis (CoA) of the elemental composition.

1. Stainless steel (NIST 1155a) ^C
2. Silicon dioxide 99.99% ^C
3. Boron 99.5% ^C
4. Carbon 99.99% ^C 
5. Manganese 99.98% ^C
6. Pin stub: Al 6082 ^C
7. Cu aperture: electroplated 99.9%, aperture size typically ±5% (non-certified material, indicative reference measurement included)

Can be mounted on these SEM brands:
FEI / Thermo Fisher, Hitachi*, Jeol*, Phenom, Tescan and Zeiss microscopes.

*Require a pin stub adapter

• Product number: CAL_STUB_6_T
• Price per unit: € 745,-

Looking for a non-traceable standard? Please visit: 5-light element EDS calibration sample with copper grid